Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Book Description

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.

Customer Reviews:

From: Analysis, 1997.......2000-09-04

The book describes the analytical techniques based on electron diffraction, reflection and imaging in the TEM (and STEM) for the analysis of materials surfaces. As with most texts dealing with analytical techniques these days it is awash with acronyms and the ones representing the candidate methodologies are frequently encountered. These are RHEED (reflection high energy electron diffraction), REM (reflection electron microscopy), SREM (scanning REM) and REELS (reflection electron energy loss spectroscopy). Many others are included, but the author is considerate enough to define them all in the early pages of his book. The dust-cover notes state that this is 'an entirely self-contained study' in which the 'theories, techniques and applications of REM, RHEED and REELS are comprehensively reviewed'. Inspection of the text reveals that this is, indeed, the case, with three parts (logically Part A, Part B and Part C) of approximately equal length covering the three areas of reflection electron studies. This is preceded by a comprehensive review of the kinematical theory of electron diffraction. This chapter is a very helpful (and necessary) prelude to the rest of the book. It deals with kinematical scattering in the usual numerical manner but the associated text makes this chapter extremely readable. The main body of the text is written in an equally attractive style with the theory of the various topics being introduced alongside the experimental procedures involved. There are many applications of reflection electron microscopy and spectroscopy scattered throughout the book; although inmost cases they serve as illustrations of particular facets of the experimental procedures rather than points which emphasize the relative strengths of the candidate techniques. This is, however, a minor criticism, and the inclusion of examples of real micrographs, diffraction patterns and spectra throughout the text may provide some readers with much needed relief from the undoubted rigour of the theoretical treatments provided.

For those with a TEM background it represents, perhaps, the definitive text for reflection methods.

There are two particularly attractive aspects of this book to be found in the closing pages. The first is an extensive set (ten) of appendices which contain much useful data along with five FORTRAM programs for interpreting spectra and modeling electron beam/specimen interaction. These have presumably been widely tested in the author's laboratory and their inclusion here is to be welcomed. The other feature, warmly welcomed by this reviewer, is the inclusion of a separate index of the materials used to illustrate the various facets of the reflection techniques. Also included as an Appendix is a chronological bibliography of REM, SREM and REELS covering the years 1975-1995. RHEED is presumably excluded as it is the most senior, and widely used, of the methods considered. This book is not one for those with a peripheral interest in RHEED, REM, SREM and REELS. Referring once again to the cover notes it is offered as an 'ideal guide for scientists and graduate students working on quantitative surface structure characterization using reflection electron techniques' and there is no doubt that this target audience will appreciate the publication of such a concise, authoritative and well written text in their chosen area of endeavor. For those with a TEM background it represents, perhaps, the definitive text for reflection methods and provides all the theoretical information necessary for a thorough appreciation of these techniques. At such a reasonable price for a very specialist text one would hope that it will soon find a place on the bookshelf of every electron microscopy unit with a practical need (or even aspirations) to carry out surface structure determination in the TEM or STEM. For those with a need for such a text this book fulfills all the claims made on its behalf. Dr. Wang is to be congratulated on writing a very accessible text. The book is thoroughly recommended.

A book you must have.......2000-09-04

"It contains a lot of illustrations and excellent images and a good balance of theory and experimental techniques... it is a book that any materials science or physics libraries should be holding"

Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications

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A good reference on STM

Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications

Manufacturer: Wiley-VCH
ProductGroup: Book
Binding: Hardcover

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ASIN: 047124824X

Book Description

A practical introduction to basic theory and contemporary applications across a wide range of research disciplines

Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies.

Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices.

This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology.

Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.

Customer Reviews:

A good reference on STM.......2002-10-19

This book mainly focus on STM. However, it doesn't cover much on AFM. The use of AFM has become increasingly popular in recent years in research investigation in various areas, including cell biology, DNA research, material science, nanotechnology, and so on. The editor may consider include detailed discussion on AFM in next edition (if any).

Fourier Acoustics: Sound Radiation and Nearfield Acoustical Holography

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A must-have one

Fourier Acoustics: Sound Radiation and Nearfield Acoustical Holography
Earl G. Williams
Manufacturer: Academic Press
ProductGroup: Book
Binding: Hardcover

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ASIN: 0127539603

Book Description

Intended a both a textbook and a reference, Fourier Acoustics develops the theory of sound radiation uniquely from the viewpoint of Fourier Analysis. This powerful perspective of sound radiation provides the reader with a comprehensive and practical understanding which will enable him or her to diagnose and solve sound and vibration problems in the 21st Century. As a result of this perspective, Fourier Acoustics is able to present thoroughly and simply, for the first time in book form, the theory of nearfield acoustical holography, an important technique which has revolutionised the measurement of sound. Relying little on material outside the book, Fourier Acoustics will be invaluable as a graduate level text as well as a reference for researchers in academia and industry.

Key Features
* The physics of wave propogation and sound vibration in homogeneous media
*Acoustics, such as radiation of sound, and radiation from vibrating surfaces
*Inverse problems, such as the theory of nearfield acoustical holography
*Mathematics of specialized functions, such as spherical harmonics

Customer Reviews:

A must-have one.......2000-10-27

This is a "must have" book for everyone who deals with acoustic radiation. The treatment of nearfield acoustic holography was scattered all over the scientific literature about acoustics. Now one has a reference point, where all the main aspects of the subject are dealt with in a clear, didactic way. The chapters are very well organized, containing an introduction on the basic aspects of signal processing and leading naturally to a good understanding of the subject.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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Excellent Book on the Basics

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
S. J. B. Reed
Manufacturer: Cambridge University Press
ProductGroup: Book
Binding: Hardcover

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ASIN: 052184875X

Book Description

Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray ‘maps’ showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Download Description

Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Customer Reviews:

Excellent Book on the Basics.......2000-05-19

This book is great for someone who has a little background in physics and calculus. It gives a good breakdown of how the probe works and what kinds of analyses it works best for. This is not an in-depth book on quatitative analyses, but rather, an excellent place to start!

Radiative Decay Engineering (Topics in Fluorescence Spectroscopy)

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Radiative Decay Engineering (Topics in Fluorescence Spectroscopy)

Manufacturer: Springer
ProductGroup: Book
Binding: Hardcover

Biochemistry | Biological Sciences | Science | Subjects | Books

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ASIN: 0387226621

Book Description

During recent years our enthusiasm for Radiative Decay Engineering (RDE) has continually increased. Many of the early predictions have been confirmed experimentally. We see numerous applications for RDE in biotechnology, clinical assays and analytical chemistry. While implementation of RDE is relatively simple, understanding the principles of RDE is difficult. The concepts are widely distributed in the optics and chemical physics literature, often described in terms difficult to understand by biophysical scientists.

RDE includes chapters from the experts who have studied metal particle optics and fluorophore-metal interactions. This collection describes the fundamental principles for the widespread use of radiative decay engineering in the biological sciences and nanotechnology.

Energy Dispersive X-ray Analysis in the Electron Microscope (Microscopy Handbooks)

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Energy Dispersive X-ray Analysis in the Electron Microscope (Microscopy Handbooks)
DC Bell
Manufacturer: Garland Science
ProductGroup: Book
Binding: Hardcover

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Scanning Electron Microscopy and X-ray Microanalysis

ASIN: 1859961096

Book Description

This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.

Electron Microscopy and Analysis, Third Edition

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Electron Microscopy and Analysis, Third Edition
Peter J. Goodhew
Manufacturer: Taylor & Francis
ProductGroup: Book
Binding: Paperback

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Scanning Electron Microscopy and X-ray Microanalysis
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
An Introduction to Surface Analysis by XPS and AES
Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set)
$Transmission Electron Microscopy and Diffractometry of Materials$ Transmission Electron Microscopy and Diffractometry of Materials

ASIN: 0748409688

Book Description

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

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Electron microscopy is the process of greatly magnifying tiny particles in order to see and analyse them. An essential undergraduate textbook and laboratory manual for those working/studying in physics, chemistry, and the biological sciences

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Electron Energy Loss Spectroscopy
R. Brydson
Manufacturer: Garland Science
ProductGroup: Book
Binding: Paperback

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Electron Energy-Loss Spectroscopy in the Electron Microscope (The Language of Science)

ASIN: 1859961347

Book Description

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

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Advanced EPR

Manufacturer: Elsevier Science
ProductGroup: Book
Binding: Hardcover

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ASIN: 044488050X

Book Description

This new book provides an up-to-date survey of existing EPR techniques and their applications in biology and biochemistry, and also provides a wealth of ideas for future developments in instrumentation and theory. The material is broadly organized into four parts. In the first part (chapters 1 to 6) pulsed EPR is discussed in detail. The second part (chapters 7 to 12) provides detailed discussions of a number of novel and experimental methods. The third part comprises seven chapters on double-resonance techniques, five on ENDOR and two on optically- and reaction yield-detected resonance. The final part is devoted to a thorough discussion of a number of new developments in the application of EPR to various biological and biochemical problems.

Advanced EPR will interest biophysicists, physical biochemists, EPR spectroscopists and others who will value the extensive treatment of pulsed EPR techniques, the discussion of new developments in EPR instrumentation, and the integration of theory and experimental details as applied to problems in biology and biochemistry.

Advances in Discrete Tomography and Its Applications (Applied and Numerical Harmonic Analysis)

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Advances in Discrete Tomography and Its Applications (Applied and Numerical Harmonic Analysis)

Manufacturer: Birkhäuser Boston
ProductGroup: Book
Binding: Hardcover

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ASIN: 0817636145

Book Description

Advances in Discrete Tomography and Its Applications is a unified presentation of new methods, algorithms, and select applications that are the foundations of multidimensional image reconstruction by discrete tomographic methods. The self-contained chapters, written by leading mathematicians, engineers, and computer scientists, present cutting-edge research and results in the field.

Three main areas are covered: foundations, algorithms, and practical applications. Following an introduction that reports the recent literature of the field, the book explores various mathematical and computational problems of discrete tomography including new applications.

Topics and Features:

* introduction to discrete point X-rays

* uniqueness and additivity in discrete tomography

* network flow algorithms for discrete tomography

* convex programming and variational methods

* applications to electron microscopy, materials science, nondestructive testing, and diagnostic medicine

Professionals, researchers, practitioners, and students in mathematics, computer imaging, biomedical imaging, computer science, and image processing will find the book to be a useful guide and reference to state-of-the-art research, methods, and applications.

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