System Reliability Theory: Models, Statistical Methods, and Applications, Second Edition

Book Description

Find in-depth discussions of dependability management and reliability centered systems as well as functional safety issues—matters critical to the new IEC standards. Of note in this new second edition are:

New chapters on Reliability of Maintained Systems and Reliability Assessment of Safety-Critical Systems
Introduction and discussion of basic assessment methods for operational availability and production regularity
An FTP site for solutions, overheads, and supplementary information

Customer Reviews:

System Reliabiility Theory.......2000-03-02

This is an excellent text for learning reliability analysis. It contains just the right mixture of material to be useful for a practicing engineer that must learn the reliability business in a hurry.

The book is very clear and fairly concise. There are worked examples to demonstrate how the theory should be applied and the examples are also clear and concise.

Book Description

This practical resource presents modern, statistical methods for accelerated testing including test models, analyses of data, and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. This handy book features real test examples along with data analyses, computer programs, and references to the literature.

Customer Reviews:

Should be on every Developer and Engineer's shelf........2006-11-01

Dr. Taylor does his usual great job covering a difficult subject - ties in well with his "Applied Life Data Analysis", the revered reliability resource. Because of his GE background, he emphasizes experimental plans and analysis methods (i.e.: partially censored) which permit you to make good predictions regarding a product or system while you are still collecting data (e.g.: management wants an answer NOW, even if the experiment is not completed). A few more examples of how "typical" systems behave would be helpful, but otherwise a great resource.

Great companion volume to Applied Life Data Analysis.......2004-01-30

I agree with the previous reviewer that this is the definitive classic in accelerated life testing. It's a great companion volume to Dr. Nelson's "Applied Life Data Analysis" which remains one of the best reliability textbooks ever written. I have noticed that all major reliability and accelerated testing programs use this book as their main reference - proof of the books usefulness. My only compaint is with the publishers for the steep price - now that they're bringing out a lower cost version of Applied Life Data Analysis, I hope they'll bring out a low-cost or paperback version of this classic as well.

best statistical account of accelerated testing.......2000-06-22

Nelson is a private consultant who has worked on countless practical problems in reliability from his consulting practice and previous employment at General Electric. He is an excellent lecturer and writer. His earlier book "Applied Life Data Analysis" was considered to be one of the best texts on reliability.

Book Description

In Risk, Reliability, Uncertainty and Robustness of Water Resources Systems, thirty-five leading scientists provide state-of-the-art reviews of topical areas of research on water resources systems, including aspects of extreme hydrological events: floods and droughts, water quantity and quality, dams, reservoirs and hydraulic structures, evaluating sustainability and climate change impacts. As well as discussing essential challenges and research directions, the book will assist in applying theoretical methods to the solution of practical problems in water resources.

Statistical and Probabilistic Models in Reliability (Statistics for Industry and Technology)

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Statistical and probabilistic Models in Reliability

Statistical and Probabilistic Models in Reliability (Statistics for Industry and Technology)

Manufacturer: Birkhäuser Boston
ProductGroup: Book
Binding: Hardcover

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ASIN: 0817640681

Customer Reviews:

Statistical and probabilistic Models in Reliability.......2000-02-21

A book which is reliable to read, especially for reserachers, post-grad students

Reliability: Probabilistic Models and Statistical Methods

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The definitive introduction to reliability analysis
Excellent presentation of Reliability Math
Outstanding!

Reliability: Probabilistic Models and Statistical Methods
Lawrence Leemis
Manufacturer: Prentice Hall
ProductGroup: Book
Binding: Paperback

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ASIN: 0137205171

Book Description

Covers both the Probabalistic models and Statistical methods used by reliability engineers. It contains explanations of how the mathematical models and results apply to engineering design and the analysis of lifetime data sets. Most applications are drawn from mechanical, civil or electrical engineering systems.

Customer Reviews:

The definitive introduction to reliability analysis.......2001-02-01

This is THE seminal text on reliability analysis. The author writes with the same crystal clarity he uses to present material at technical conferences. The exercises are carefully graded to lead the diligent reader toward steadily deepening understanding of the material. All diagrams are clear, cogent, carefully annotated, and well keyed to accompanying text. The definition and explanations of cut sets are especially good, allowing the engineer or analyst to economically reduce a complex problem to a set of smaller, more mathematically tractable problems. Also, this work does an excellent job of ramping the reader's knowledge upward from the justifiably assumes prerequisite of basic statistics learned in one introductory class presumably having a calculus prerequisite.

Excellent presentation of Reliability Math.......2000-02-05

I have to give it to this author, he has a very high assumption of math. If you are not a math wiz but can comprehend Calculus, this book is beyond outstanding. I will give the reader the necessary math methods for achieving you reliability analysis correctly. I spent alot of time going through these calcs and doing the proofs they are with out a dought right on the money. The boo is packed full of wonderful examples and methods. Kudos to the author.

Outstanding!.......1999-10-13

This is definitely the best text on Reliability Engineering that I've seen. Leemis really brings the material to life in a way that I have not seen replicated in the other texts that I have perused. For a first introduction to Reliability, I cannot think of a better text. The reader should have a solid foundation in mathematical statistics, however, before starting on this volume. An adequate resource for building this foundation is Larson and Marx's "Introduction to Mathematical Statistics". Especially make sure you understand the basics of maximum-likelihood, as Leemis emphasizes it in his derivations -- the more advanced stuff you'll learn about in his book, however.

Book Description

Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include:

What does the confidence level associated with the use of statistical model mean?
Is the numerical result associated with a high confidence level beyond dispute?
When is it appropriate to use the exponential (constant hazard rate) model? Does this model always provide the most conservative reliability estimate?
Are the results of traditional `random' failure hazard rate calculations tenable? Are there persuasive alternatives?
What model should be used to describe the useful life of a device when wearout is absent?
When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected?
Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability?

Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICs and lasers.

Customer Reviews:

Best introductory book on this subject.......2007-07-13

This is a practical book that teaches the "how-to" on device reliability. Before reading this book, I thought "Applied Reliability" by Tobias and Trindade was the best introductory book in this field. Similar to Tobias and Trindade, this book is short and straight-forward. There are absolutely no fillers and it provides a lot of original concepts (e.g. AT&T Tech J vol64), industrial practice (e.g. chap 8 device qualification), and intuitive thinking that are hard to find in other similar books. Books like "statistical methods for reliability data" by Meeker and Escobar or "Accelerated Testing: Statistical Models, Test Plans, and Data Analyses" by Nelson tend to be dry and contain too much information that may confuse readers. Reading Nash first may help clarify the confusion and reinforce the fundamentals before exploring other alternatives.

I also find this book supplements well with "Reliability and degradation of semiconductor lasers and LEDs" by Fukuda and "Reliability and Degradation of III-V Optical Devices" by Ueda. The only shortcomings of this book is its expensive price.

The best reliability book out there for my money.......2000-06-28

Most reliability books end up being very dry, and filled with equations with little explanation of WHY each of the distributions are used, or how you can go wrong. This book is very different. The author brings up concrete examples of mistakes which are routinely made by inexperienced engineers. He explains clearly which distribution is reasonable for various types of applications. The book is interesting to read, for the most part. (Okay, it still has a few boring chapters at the start, which I recommend skipping.) He even uses the example of human mortality to clearly illustrate concepts of "failure rate" in a way which gets rid of confusion. Finally, the book concludes with a case study for qualifying a high-reliability laser for use in undersea fiber optic communication links. While Franklin Nash's short course is the best I've ever taken, short of seeing him in person, reading this book is the next best thing. (In fact, I'd recommend the book even if you were going to attend the short course.) I've read it several different times in my job as a reliability engineer, and have obtained an understanding of the field that I haven't seen explained as well anywhere else. I give this book my strongest recommendation.

Modern Statistical And Mathematical Methods in Reliability (Quality, Reliability and Engineering Statistics) (Quality, Reliability and Engineering Statistics)

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Modern Statistical And Mathematical Methods in Reliability (Quality, Reliability and Engineering Statistics) (Quality, Reliability and Engineering Statistics)
Yvonne Armijo
Manufacturer: World Scientific Publishing Company
ProductGroup: Book
Binding: Hardcover

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ASIN: 9812563563

Product Description

This volume contains extended versions of 28 carefully selected and reviewed papers presented at The Fourth International Conference on Mathematical Methods in Reliability in Santa Fe, New Mexico, June 2125, 2004, the leading conference in reliability research. The meeting serves as a forum for discussing fundamental issues on mathematical methods in reliability theory and its applications. A broad overview of current research activities in reliability theory and its applications is provided with coverage on reliability modeling, network and system reliability, Bayesian methods, survival analysis, degradation and maintenance modeling, and software reliability. The contributors are all leading experts in the field and include the plenary session speakers, Tim Bedford, Thierry Duchesne, Henry Wynn, Vicki Bier, Edsel Pena, Michael Hamada, and Todd Graves.

Mathematical and Statistical Methods in Reliability (Quality, Reliability and Engineering Statistics, 7)

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Mathematical and Statistical Methods in Reliability (Quality, Reliability and Engineering Statistics, 7)

Manufacturer: World Scientific Publishing Company
ProductGroup: Book
Binding: Hardcover

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ASIN: 9812383212

Book Description

This book contains extended versions of 34 carefully selected and reviewed papers presented at the Third International Conference on Mathematical Methods in Reliability, held in Trondheim, Norway in 2002. It provides a broad overview of current research activities in reliability theory and its applications. There are chapters on reliability modelling, network and system reliability, reliability optimization, survival analysis, degradation and maintenance modelling, and software reliability. The authors are all leading experts in the field.

Book Description

This is a practical text for those who wish to analyse data from Reliability studies. The emphasis is on clear explanation of the techniques used, supported by extensive mathematical and statistical background and nature of the data before it is analysed. There are chapters on survival analysis, using illuminating case studies.

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