Average customer rating:
- Good Book
- Great book!
- Comprehensive and up-to-date for Low power CMOS Design
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Low Power CMOS VLSI: Circuit Design
Kaushik Roy , and
Sharat Prasad
Manufacturer: Wiley-Interscience
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Similar Items:
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Leakage in Nanometer CMOS Technologies (Series on Integrated Circuits and Systems)
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Low-Power CMOS Design
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Practical Low Power Digital VLSI Design
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Multi-voltage CMOS Circuit Design
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Digital System Clocking: High-Performance and Low-Power Aspects
ASIN: 047111488X |
Book Description
A comprehensive look at the rapidly growing field of low-power VLSI design
Low-power VLSI circuit design is a dynamic research area driven by the growing reliance on battery-powered portable computing and wireless communications products. In addition, it has become critical to the continued progress of high-performance and reliable microelectronic systems. This self-contained volume clearly introduces each topic, incorporates dozens of illustrations, and concludes chapters with summaries and references. VLSI circuit and CAD engineers as well as researchers in universities and industry will find ample information on tools and techniques for design and optimization of low-power electronic systems. Topics include:
- Fundamentals of power dissipation in microelectronic devices
- Estimation of power dissipation due to switching, short circuit, subthreshold leakage, and diode leakage currents
- Design and test of low-voltage CMOS circuits
- Power-conscious logic and high-level synthesis
- Low-power static RAM architecture
- Energy recovery techniques
- Software power estimation and optimization
Customer Reviews:
Good Book.......2002-03-31
The most upto date book on low-power design methods. Some information is redundant and can be eliminated from the book. The chapter on the physics of a transistor is excellent. THERE ARE A LOT OF TYPOS IN THE BOOK!
Great book!.......2000-10-11
This book was very helpful for me to understand about modern low-power chip design,also made me save my times to search the papers about this topic. Great book.
Comprehensive and up-to-date for Low power CMOS Design.......2000-06-21
It is the most comprehensive book in the low power CMOS design area, which covers the low power methods in different levels.
Book Description
Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.
The book consists of:
Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling;
Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test;
Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing;
Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.
Customer Reviews:
Not a good book for ATE.......2003-10-20
It seems to me it is just a summary of work done by others in
the ATE field over the years. The explanations of how a device
fault is detected are not clear in most of the cases presented
in the book. The book emphasizes too much on fault
modeling but not enough on test applications and techniques.
Certainly not a good text book for students nor it
is a good book for ATE engineers. However, if you are looking
for some quick reference, this book is a good place to start
because it contains brief summaries of other people's work.
Excellent textbook for VLSI testing........2003-04-19
This book is, as far as I know, the most comprehensive texbook on VLSI testing available at the moment. It is based on current trends and techniques in the field. After all, the authors are pioneers in this area. A worthy successor to Abramovici's earlier textbook, which, I think is beginning to look increasingly archaic. As a guy who's taken a course in testing by the authors (we were the guinea pigs for the book, actually)and is currently working in the VLSI testing area, I strongly recommend it to anyone looking to build strong testing fundamentals.
Average customer rating:
- Reader
- Integrated view of modern CMOS technology from the world expert
- Excellent source on MODERN silicon vlsi technology
- Excellent combinations of basics & updated research
|
Silicon VLSI Technology: Fundamentals, Practice, and Modeling
James D. Plummer ,
Michael D. Deal , and
Peter B. Griffin
Manufacturer: Prentice Hall
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Similar Items:
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The Science and Engineering of Microelectronic Fabrication
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Fundamentals of Modern VLSI Devices
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Introduction to Microelectronic Fabrication: Volume 5 of Modular Series on Solid State Devices (2nd Edition)
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Semiconductor Device Fundamentals
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The Materials Science of Thin Films
ASIN: 0130850373 |
Customer Reviews:
Reader.......2007-02-20
A superbly written book on fabrication of silicon integrated circuits.Chapter 2 provides a gentle yet fairly detailed introduction to the overall process and each item touched therein is expanded subsequently.The language is clear and figures convey their intended meaning,overall its a wonderful starting point for further study in silicon integrated circuits technology.As has been pointed out in one of the reviews here, this book has been adopted in many US universities.The link embedded in this review is one such instance and as such can be used to obtain more information and benefit from a full set of audio lectures, assignemnts and other supplementary material as a part of MIT's open course ware program.The instructor is Prof Judy Hoyt.
[...]
Integrated view of modern CMOS technology from the world expert.......2006-08-16
I've read a number of books in this field - Plummer, Wolf, Campbell, Sze, Madou. Each book has its strength, and Plummer's book stands out in terms of its broad, in-depth coverage of modern silicon CMOS technology. It doesn't cover MEMS or other exotic nanofabrication.
Many students who've read the book said that Chap 2, where a modern CMOS process flow is described step by step from the substrate to back-end, was the best part. By doing so, the authors teach us that not only unit processes but their collection, i.e. process integration, is the key in successful CMOS technology.
Overall, the quality of the content and attention to small details are superb, as one can expect from a book written by one of world's foremost researchers in the field (Plummer is the Dean of Engineering School at Stanford). In particular, I liked chap2 for integrated description of CMOS flow, the lithography chapter which covers optical systems, details of photoresists, phase shift masking. Also, diffusion and ion implantation parts are second to none, since the authors made numerous contributions to the research field. It's such pleasure to learn about the latest in silicon IC processing from the Silicon Valley authority at Stanford!
The book has been adopted by many US engineering schools already, and I see it on many bookshelves belonging to IC engineers. If you need an authoritive, well-organized reference for modern silicon IC processing, I strongly recommend this book.
Excellent source on MODERN silicon vlsi technology.......2005-02-13
The best part of this book is that it covers modern fabrication technology. I expecially liked the approach of introducing the complete CMOS fabrication flow in the beginning. It puts a context to following chapters. It is what I call system level approach for slicon fabrication. There is also emphasis on measurement and simulutions that are missing from traditional books. Both these are essential to modern technology. Also, I was very happy to see details on manufacturing choices - e.g. LOCOS vs STI. Explanations are clear.
This is a text book, therefore at times may seem too dense, but definitely worth it if you are a process engineer.
Excellent combinations of basics & updated research.......2000-09-01
Before this book was published, Wolf & Tauber's book was the only good reference I had. Plummer's new book has a thorough review of basic principles, very well updated parts on current manufacturing equipments (Wolf's book also has extensive coverage in this respect). The best part in my opinion is oxidation & diffusion parts where the authors are one of the leaders in current research. The book not only focuses on the specific details, but also gives an integrated view of the whole CMOS fabrication process, which I enjoyed a lot.
I strongly recommend this book for students who want to learn basics of IC fabrication and also professional engineers who needs a good and well updated reference.
Average customer rating:
- Reader
- Bible for microelectronic device engineer
- Fundamentals of Modern VLSI Devices
- Frustrating, but recommended
- best textbook i used
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Fundamentals of Modern VLSI Devices
Yuan Taur , and
Tak H. Ning
Manufacturer: Cambridge University Press
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Silicon VLSI Technology: Fundamentals, Practice, and Modeling
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Device Electronics for Integrated Circuits
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Semiconductor Material and Device Characterization
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Advanced Semiconductor Fundamentals (2nd Edition)
ASIN: 0521559596 |
Book Description
This book examines in detail the basic properties and design, including chip integration, of CMOS and bipolar VLSI devices and discusses the various factors that affect their performance. The authors begin with a thorough review of the relevant aspects of semiconductor physics, and proceed to a description of the design of CMOS and bipolar devices. The optimization of these devices for VLSI applications is also covered. The authors highlight the intricate interdependencies and subtle tradeoffs between those device parameters, such as power consumption and packing density, that affect circuit performance and manufacturability. They also discuss in detail the scaling, and physical limits to the scaling, of CMOS and bipolar devices. The book contains many exercises, and can be used as a textbook for senior undergraduate or first-year graduate courses on microelectronics or VLSI devices. It will also be a valuable reference volume for practicing engineers involved in research and development in the electronics industry.
Customer Reviews:
Reader.......2006-12-15
If you seek to understand devices from a physical point of view this book just fails to live up to it.I read the chapters on MOSFETs' thoroughly and also the section of second chapter which describes MOS capacitor.The feel you get when you read the book is somewhat hard to write, it has all the relevant equations but lacks a physical insight.For example the quantum confinement of the inversion layer is so briefly described that someone reading the topic for the first time will never be able to make sense out of it.For those who know device physics, rather well, this book provides great material, drawn primarily from the authors' experience at IBM's T J watson research lab.As a suggestion Dr.Taur has a few papers, available online for free download at IBM's research and development journal,it will be a good idea to explore it and the other allied material appearing there.For the starter I will suggest to pick up Tsividis book on "Operation and modeling of MOS Transistor" and concurrently try the present volume.A better physical model can be developed.
Bible for microelectronic device engineer.......2006-06-04
It covers most of the interesting fields in short channel device research/engineering. In addition, there is one chapter focused on device design from scaling point of view; and another one talking about the CMOS logic performance, which is not common in device book.
Also, this is an excellent device book balanced between physics and mathematics - another plus.
Fundamentals of Modern VLSI Devices.......2006-02-18
It's new and arrived very quickly. The book is very informative.
Frustrating, but recommended.......2003-04-10
The physicist in me wants to give this book 2 stars and the mathemetician in me wants to give it 5 stars, while the engineer and organizer in me wants to give it 4 stars. End result is 4 stars, but frustrated with the linear grading system. Here's a bit more on why.
Yes, as previous reviewers have said, this book gives you what many similarly named books don't: an advanced-level, industrial-view, practioner look at semiconductor device operation and design. It is well organized from that standpoint, which originally drew me in wholeheartedly.
My criticism is that when you really get into it -- and I have, by reading every page from start to finish -- the authors sometimes only use the math equations to explain why things happen. I guess this is okay in some science topics say, for abstract problems in QM matrix formalism when the "thing" is difficult to visualize physically, but this is a working, quasi-classical, real-world "machine"; physical explanations should almost always be possible. Writing about the concepts in addition to the math equations is important because most of us don't remember dozens of math equations day-to-day, but only the relationships often buttressed up by physical pictures. For example, on page 187 an equation (and equations are models of reality themselves containing their own limitations) is used to show (prove?) "the gate work function has a major effect on channel profile design, since, through the V_fb term, it has a strong influence on the MOSFET threshold voltage". In addition to the math symbolic relationship, this could also be said with physical underpinnings or something more physical sounding than "through the V_fb term".
People tend to solve problems either with: (1) pictures, (2) math, or (3) words, or combinations of these, so perhaps this is just a matter of which style is more 'natural' to a person. However, this pattern of occasionally only using math symbols to explain advanced concepts is done throughout the text. I think for an advanced text, deep physical understanding is sought, not just developing equations from standard theories; the theories breakdown under some conditions and only a good understanding of the advanced concepts will inform you when that might happen. Such understanding allows you to be on the lookout for the exceptions, which is important for the practicing engineer or researcher in this field.
best textbook i used.......2002-05-19
this is the best textbook i used. you can realize how deep and clear of understanding the device physics the Dr. Taur is!
my feeling is many professors at university teaching this kind of device classes only understand 70% - 80% of vlsi device physics
even the ieee fellow! i believe many readers agree what i said.
based on my 7 yrs industrial research experience, i recommend
person who wants to be a device engineer should read this book, and don't skip any chapter. It's not easy for a circuit designer to understand all the contents, but it's helpful sometimes for their design. anyway, i suggest professors to use this book as a senior device textbook, and professors/IEEE fellows can clarify their confused concepts from this book.
Average customer rating:
- Finally one solid memory design book
|
VLSI Memory Chip Design (Springer Series in Advanced Microelectronics) (Springer Series in Advanced Microelectronics)
Kiyoo Itoh
Manufacturer: Springer
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Advanced Semiconductor Memories: Architectures, Designs, and Applications
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CMOS Circuit Design, Layout, and Simulation, Second Edition
ASIN: 3540678204 |
Product Description
This book features a systematic description of microelectronic device design ranging from the basics to current topics, such as low-power/ultralow-voltage designs including subthreshold current reduction, memory subsystem designs for modern DRAMs and various on-chip supply-voltage conversion techniques. It also covers process and device issues as well as design issues relating to systems, circuits, devices and processes, such as signal-to-noise and redundancy.
Customer Reviews:
Finally one solid memory design book.......2004-05-01
This is one of the well-written books in the field of custom circuit design. Overall organization and all chapters are well written. Circuit design details are excellent. Some of the noise analysis and pitfalls of memory design are very good. Treatment on high-performance and low power memory design is superb. Great JOB.
Book Description
The only one of its kind devoted entirely to the subject,
Large Eddy Simulation presents a comprehensive account and a unified view of this young but very rich discipline. LES is the only efficient technique for approaching high Reynolds numbers when simulating industrial, natural or experimental configurations. The author concentrates on incompressible fluids and chooses topics well to treat both the mathematical ideas and the applications with care. The book addresses researchers as well as graduate students and engineers. The second edition was a greatly enriched version motivated both by the increasing theoretical interest in LES and the increasing number of applications. Two entirely new chapters were devoted to the coupling of LES with multiresolution multidomain techniques and to the new hybrid approaches that relate the LES procedures to the classical statistical methods based on the Reynolds-Averaged Navier-Stokes equations.
This 3rd edition adds various sections to the text like a careful error analysis, on filtered density function models and multiscale models. It also contains two new chapters on the prediction of scalars using LES which are of considerable interest for engineering and geophysical modeling. The part on geophysical flow has much to offer on a critical current issue.
Customer Reviews:
Good Book!!.......2007-07-12
Great Job, this book is good, but is very tiring. Because the subject is extensive.
Thank you!!
An atlas of large-eddy simulation.......2006-06-02
This book presents the current status of Large-Eddy Simulation (LES) and is invaluable for anyone working on the field.
The author presents all relevant subgrid scale models, the theoretical basis of the method, lessons from practical cases, etc
It is no accident that this is the 3rd revision in 4 years, collecting forewords from leading theoreticians along the way: Germano, Lesieur and Meneveau.
Average customer rating:
|
Vlsi Testing: Digital and Mixed Analogue/Digital Techniques (Circuits, Devices and Systems Series)
Stanley L. Hurst
Manufacturer: Institution of Electrical Engineers
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ASIN: 0852969015 |
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Introduction to IDDQ Testing (Frontiers in Electronic Testing)
S. Chakravarty , and
Paul J. Thadikaran
Manufacturer: Springer
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Binding: Hardcover
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ASIN: 0792399455 |
Book Description
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective.
A new approach to testing digital circuits, which has come to be known as I
DDQ testing, has been actively researched for the last fifteen years. In I
DDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that I
DDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson.
This increase in the use of I
DDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.
Introduction to I
DDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Average customer rating:
|
Timing Analysis and Optimization of Sequential Circuits
Naresh Maheshwari , and
S. Sapatnekar
Manufacturer: Springer
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ASIN: 0792383214 |
Book Description
Recent years have seen rapid strides in the level of sophistication of VLSI circuits. On the performance front, there is a vital need for techniques to design fast, low-power chips with minimum area for increasingly complex systems, while on the economic side there is the vastly increased pressure of time-to-market. These pressures have made the use of CAD tools mandatory in designing complex systems.
Timing Analysis and Optimization of Sequential Circuits describes CAD algorithms for analyzing and optimizing the timing behavior of sequential circuits with special reference to performance parameters such as power and area. A unified approach to performance analysis and optimization of sequential circuits is presented. The state of the art in timing analysis and optimization techniques is described for circuits using edge-triggered or level-sensitive memory elements. Specific emphasis is placed on two methods that are true sequential timing optimizations techniques: retiming and clock skew optimization.
Timing Analysis and Optimization of Sequential Circuits covers the following topics:
- Algorithms for sequential timing analysis
- Fast algorithms for clock skew optimization and their applications
- Efficient techniques for retiming large sequential circuits
- Coupling sequential and combinational optimizations.
Timing Analysis and Optimization of Sequential Circuits is written for graduate students, researchers and professionals in the area of CAD for VLSI and VLSI circuit design.
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Layout Optimization in VLSI Design (Network Theory and Applications)
Manufacturer: Springer
ProductGroup: Book
Binding: Hardcover
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ASIN: 1402000898 |
Book Description
The exponential scaling of feature sizes in semiconductor technologies has side-effects on layout optimization, related to effects such as interconnect delay, noise, crosstalk, signal integrity, parasitics effects, and power dissipation, that invalidate the assumptions that form the basis of previous design methodologies and tools. This book is intended to sample the most important, contemporary, and advanced layout optimization problems emerging with the advent of very deep submicron technologies in semiconductor processing.
Audience: A reference work for graduate students, senior undergraduates, and researchers.
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